Semiconductor Electrical Safety Part 2: Developing a Risk-Based Approach to Electrical Safety StdPbc-0718 atomic force microscopy (AFM)

atomic force microscopy (AFM)

covered by native oxide

2-0211 (Reapproved 0623)

corrosion is not measured directly

SEMI E54-0710 (designation update)

Semiconductor Electrical Safety Part 2: Developing a Risk-Based Approach to Electrical Safety StdPbc-0718 atomic force microscopy (AFM)Course Description To protect yourself from shock and electrocution, you must understand electrical hazards in your semiconductor workplace. Take this course to learn about different electrical risk assessments and protective measures that may be implemented. Ideal learners are semiconductor fabrication workers. Course Objectives Identify how NFPS 70E applies to semiconductors fabrication facilities. Select information that must be included in risk